Helium Ion Microscope from Canada
Helium ion microscopes use He+ ions for sub-nanometer surface imaging with minimal sample damage. HTS 9012.10.00.00 as charged particle non-optical microscope. Superior for insulators and beam-sensitive materials.
Duty Rate — Canada → United States
10%
Rate breakdown
9903.05.2910%Except for products described in headings 9903.05.85–9903.05.93, articles the product of Canada, as provided for in U.S. note 52 to this subchapter
Import Tips
• Include ion source gas handling system details
• Certify for noble gas containment