Field Emission Microscope from Japan
Field emission microscopes utilize field-emitted electrons to image surfaces at high resolution under ultra-high vacuum. Fits HTS 9012.10.00.00 as electron-based non-optical microscope. Used for catalysis and surface physics studies.
Duty Rate — Japan → United States
12.5%
Rate breakdown
9903.05.4912.5%Except for products described in headings 9903.05.85–9903.05.92, articles the product of Japan, with an ad valorem (or ad valorem equivalent) rate of duty under column 1 less than 12.5 percent, as provided for in U.S. note 52 to this subchapter
Import Tips
• Include emitter tip specifications and vacuum pump ratings
• Certify high-voltage safety interlocks
• Avoid bundling with spectrometers to maintain 9012 classification