Electron Probe Microanalyzer (EPMA) from Japan
Electron probe microanalyzers (EPMA) combine electron microscopy with X-ray spectrometry for elemental analysis at microscale. Under HTS 9012.10.00.00 for its primary electron microscope function. Key for geochemistry and metallurgy.
Duty Rate — Japan → United States
12.5%
Rate breakdown
9903.05.4912.5%Except for products described in headings 9903.05.85–9903.05.92, articles the product of Japan, with an ad valorem (or ad valorem equivalent) rate of duty under column 1 less than 12.5 percent, as provided for in U.S. note 52 to this subchapter
Import Tips
• Specify wavelength dispersive spectrometer (WDS) details
• Include calibration standard requirements