PVD Quartz Crystal Monitor Sensor from Mexico
A sensor using quartz crystal microbalance to measure film thickness in real-time during PVD processes. Mounted inside deposition chambers of 8543.70 apparatus for precise process control. Vital for quality assurance in optical and semiconductor coatings.
Duty Rate — Mexico → United States
10%
Rate breakdown
9903.05.5510%Section 301 (forced labor) — additional 10% ad valorem on products of Mexico
Import Tips
• Calibrate and certify frequency specs (e.g
• 6 MHz crystals); include software interface details; declare as process monitor to distinguish from measuring instruments