PVD Quartz Crystal Monitor Sensor from Japan
A sensor using quartz crystal microbalance to measure film thickness in real-time during PVD processes. Mounted inside deposition chambers of 8543.70 apparatus for precise process control. Vital for quality assurance in optical and semiconductor coatings.
Duty Rate — Japan → United States
12.5%
Rate breakdown
9903.05.4912.5%Section 301 (forced labor) — Japan (col1 rate < 12.5 percent): MFN < 12.5% → total duty capped at 12.5%
Import Tips
• Calibrate and certify frequency specs (e.g
• 6 MHz crystals); include software interface details; declare as process monitor to distinguish from measuring instruments