Wafer Inspection Stepper Interface PCA from Mexico
PCA for stage motion control in step-and-repeat wafer inspection systems mapping defects pre-lithography. Under HTS 8473.30.1180 as printed circuit accessory for 8471 inspection machines, excluding CRTs. Sub-micron alignment critical.
Duty Rate — Mexico → United States
25%
Rate breakdown
9903.79.0125%Semiconductor articles as provided for in subdivisions (a) and (b) of U.S. note 39 to this subchapter
9903.03.030%Articles the product of any country, as provided for in subdivision (aa)(ii) of U.S. note 2 to this subchapter
9903.03.060%Articles of aluminum, of steel, or of copper or derivative aluminum or steel articles; passenger vehicles (sedans, sport utility vehicles, crossover utility vehicles, minivans, and cargo vans) and light trucks; parts of passenger vehicles (sedans, sport utility vehicles, crossover utility vehicles, minivans, and cargo vans) and light trucks; medium- and heavy-duty vehicles; parts of medium- and heavy-duty vehicles; wood products; and semiconductor articles, of any country, as provided in subdivision (aa)(v) of U.S. note 2 to this subchapter
Import Tips
• Overlay accuracy specs (<50nm) confirm classification
• Stage vibration isolation certs
• Laser safety class documentation