Wafer Inspection Stepper Interface PCA from Japan
PCA for stage motion control in step-and-repeat wafer inspection systems mapping defects pre-lithography. Under HTS 8473.30.1180 as printed circuit accessory for 8471 inspection machines, excluding CRTs. Sub-micron alignment critical.
Duty Rate — Japan → United States
25%
Rate breakdown
9903.79.0125%Semiconductor articles as provided for in subdivisions (a) and (b) of U.S. note 39 to this subchapter
9903.05.860%Articles provided for in subdivision (b) of U.S. note 52 to this subchapter
9903.05.900%Articles of aluminum, of steel or of copper or derivative aluminum or steel articles; passenger vehicles (sedans, sport utility vehicles, crossover utility vehicles, minivans and cargo vans) and light trucks; parts of passenger vehicles (sedans, sport utility vehicles, crossover utility vehicles, minivans and cargo vans) and light trucks; medium- and heavy-duty vehicles; parts of medium- and heavy-duty vehicles; wood products; patented pharmaceutical articles; and semiconductor articles, as provided in subdivision (f) of U.S. note 52 to this subchapter
Import Tips
• Overlay accuracy specs (<50nm) confirm classification
• Stage vibration isolation certs
• Laser safety class documentation