Semiconductor Wafer Prober Test PCB from Japan
A printed circuit assembly designed specifically for control electronics in wafer probers used to test semiconductor devices during manufacturing. It falls under HTS 8473.30.1180 as a part suitable solely for machines of heading 8471, such as semiconductor testing equipment, without incorporating a cathode ray tube. This PCA handles signal processing and interfacing for precise wafer probing.
Duty Rate — Japan → United States
25%
Rate breakdown
9903.79.0125%Semiconductor articles as provided for in subdivisions (a) and (b) of U.S. note 39 to this subchapter
9903.03.030%Articles the product of any country, as provided for in subdivision (aa)(ii) of U.S. note 2 to this subchapter
Import Tips
• Verify the PCA is dedicated solely to 8471 machines via technical specs and manufacturer declarations to avoid reclassification
• Include detailed invoices specifying semiconductor end-use and exclude any CRT components for smooth customs clearance