Semiconductor Wafer Prober Test PCB from China
A printed circuit assembly designed specifically for control electronics in wafer probers used to test semiconductor devices during manufacturing. It falls under HTS 8473.30.1180 as a part suitable solely for machines of heading 8471, such as semiconductor testing equipment, without incorporating a cathode ray tube. This PCA handles signal processing and interfacing for precise wafer probing.
Duty Rate — China → United States
50%
Rate breakdown
9903.79.0125%Semiconductor articles as provided for in subdivisions (a) and (b) of U.S. note 39 to this subchapter
9903.88.0325%Except as provided in headings 9903.88.13, 9903.88.18, 9903.88.33, 9903.88.34, 9903.88.35, 9903.88.36, 9903.88.37, 9903.88.38, 9903.88.40, 9903.88.41, 9903.88.43, 9903.88.45, 9903.88.46, 9903.88.48, 9903.88.56, 9903.88.64, 9903.88.66, 9903.88.67, 9903.88.68, or 9903.88.69, articles the product of China, as provided for in U.S. note 20(e) to this subchapter and as provided for in the subheadings enumerated in U.S. note 20(f)
9903.05.860%Universal product exemption (U.S. note 52(b))
9903.05.900%Articles already subject to Section 232 (steel/aluminum/copper + derivatives, autos + parts, wood, medium/heavy vehicles + parts, semiconductors, patented pharma) — U.S. note 52(f)
Import Tips
• Verify the PCA is dedicated solely to 8471 machines via technical specs and manufacturer declarations to avoid reclassification
• Include detailed invoices specifying semiconductor end-use and exclude any CRT components for smooth customs clearance