Semiconductor Wafer Prober Test PCB from Canada
A printed circuit assembly designed specifically for control electronics in wafer probers used to test semiconductor devices during manufacturing. It falls under HTS 8473.30.1180 as a part suitable solely for machines of heading 8471, such as semiconductor testing equipment, without incorporating a cathode ray tube. This PCA handles signal processing and interfacing for precise wafer probing.
Duty Rate — Canada → United States
25%
Rate breakdown
9903.79.0125%Semiconductor articles as provided for in subdivisions (a) and (b) of U.S. note 39 to this subchapter
9903.05.860%Universal product exemption (U.S. note 52(b))
9903.05.900%Articles already subject to Section 232 (steel/aluminum/copper + derivatives, autos + parts, wood, medium/heavy vehicles + parts, semiconductors, patented pharma) — U.S. note 52(f)
Import Tips
• Verify the PCA is dedicated solely to 8471 machines via technical specs and manufacturer declarations to avoid reclassification
• Include detailed invoices specifying semiconductor end-use and exclude any CRT components for smooth customs clearance