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8473.29.00.00/Wafer Thickness Measuring Gauge/Canada

Wafer Thickness Measuring Gauge from Canada

Non-contact capacitive or laser gauges measure semiconductor wafer thickness to nanometer precision during processing. While often Chapter 90, integrated process control units for heading 8470 machines fall under HTS 8473.29.00.00.

Duty Rate — Canada → United States

10%

Rate breakdown

9903.05.2910%Section 301 (forced labor) — additional 10% ad valorem on products of Canada
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Import Tips

• Prove integration with automated wafer handling

• Distinguish from standalone metrology tools

• Include RS-232/ethernet fab interface specs

Wafer Thickness Measuring Gauge from Canada — Import Duty Rate | HTS 8473.29.00.00