</>Build with Tariff Intelligence|Programmatic access to tariff calculations and HS code classification.Explore Developer Resources →
8419.89.95.40/Test Wafer Cooling Station/Japan

Test Wafer Cooling Station from Japan

Cooling station for monitor/test wafers used in semiconductor equipment qualification, rapidly bringing 300mm wafers from process temperatures to ambient. HTS 8419.89.9540 cooling for semiconductor testing preparation per statistical notes. Used before metrology.

Duty Rate — Japan → United States

12.5%

Rate breakdown

9903.05.4912.5%Section 301 (forced labor) — Japan (col1 rate < 12.5 percent): MFN < 12.5% → total duty capped at 12.5%
Calculate with your customs valueVerify classification with AI

Import Tips

• Document test/monitor wafer protocols and fab qualification procedures

• Distinguish from product wafer processing cooling