Test Wafer Cooling Station from Japan
Cooling station for monitor/test wafers used in semiconductor equipment qualification, rapidly bringing 300mm wafers from process temperatures to ambient. HTS 8419.89.9540 cooling for semiconductor testing preparation per statistical notes. Used before metrology.
Duty Rate — Japan → United States
12.5%
Rate breakdown
9903.05.4912.5%Except for products described in headings 9903.05.85–9903.05.92, articles the product of Japan, with an ad valorem (or ad valorem equivalent) rate of duty under column 1 less than 12.5 percent, as provided for in U.S. note 52 to this subchapter
Import Tips
• Document test/monitor wafer protocols and fab qualification procedures
• Distinguish from product wafer processing cooling