8414.80.90.00/Wafer Metrology Vacuum Stage/Japan

Wafer Metrology Vacuum Stage from Japan

Precision vacuum chuck with non-contact pins for semiconductor wafer thickness, bow/warp metrology maintaining <1μm positioning accuracy. 8414.80.90.00 for metrology vacuum holding systems.

Duty Rate — Japan → United States

12.5%

Rate breakdown

9903.05.4912.5%Section 301 (forced labor) — Japan (col1 rate < 12.5 percent): MFN < 12.5% → total duty capped at 12.5%

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Import Tips

• Specify positioning repeatability (<0.5μm) and vacuum uniformity

• Document supported metrology tools (ellipsometry, reflectometry)

• Include particle add-count testing results