EUV Mask Inspector from Mexico
A specialized inspector for extreme ultraviolet (EUV) lithography masks, detecting phase defects and absorber irregularities critical for advanced semiconductor nodes. It uses actinic wavelength imaging to perform optical inspection. This qualifies as an other optical measuring or checking instrument under tariff item 9031.49.90.
Duty Rate — Mexico → Canada
0%
Import Tips
• Provide CBSA with documentation showing the actinic imaging technology to confirm classification as an optical instrument
• Check if the inspector qualifies for tariff relief under programs for scientific or semiconductor equipment
• Confirm whether the goods are subject to any export controls from the country of origin before shipping