Onto Innovation Firefly NDT Wafer Defect Review System from Mexico
A high-throughput noise defect termination system for patterned wafer review using broadband plasma illumination and programmable apertures. Automates defect classification for semiconductor process control, and is classified under 9031.41.00 as it inspects semiconductor wafers.
Duty Rate — Mexico → Canada
0%
Import Tips
• Classify under 9031.41.00 for optical inspection of semiconductor wafers
• Keep documentation on its use in semiconductor process control
• Consider duty relief if used in a certified manufacturing process