Power Semiconductor Wafer Mapper from China
A high-voltage probe system that maps electrical characteristics of power device wafers such as MOSFETs and IGBTs, testing breakdown voltage distribution for automotive and energy applications. It is used in semiconductor fabrication to ensure power device reliability. This equipment is classified under tariff item 9030.82.00 as it measures or checks semiconductor wafers.
Duty Rate — China → Canada
0%
Import Tips
• Ensure the mapper's high-voltage testing capability is documented to support classification under 9030.82.00
• If the system includes safety-certified components, have certificates ready for CBSA inspection
• Check if the equipment qualifies for the Accelerated Capital Cost Allowance for clean energy equipment if used in energy applications