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9813.00.30/Semiconductor Wafer Test Sample/Mexico

Semiconductor Wafer Test Sample from Mexico

8-inch silicon wafer with experimental 3nm process node structures for yield analysis and electrical characterization. Imported by chip design fab for process development testing. Classified 9813.00.30 for semiconductor R&D testing.

Duty Rate — Mexico → United States

10%

Rate breakdown

9903.05.5510%Except for products described in headings 9903.05.85–9903.05.92 and 9903.05.94, articles the product of Mexico, as provided for in U.S. note 52 to this subchapter
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Import Tips

• Include process node specifications and test matrix documentation

• Class 100 cleanroom transport protocols required for entry

• Wafer maps showing test structures prevent production wafer classification

Semiconductor Wafer Test Sample from Mexico — Import Duty Rate | HTS 9813.00.30