Atomic Force Microscope Cantilever Cleaning Station from Japan
Plasma cleaning station specifically designed for AFM cantilevers and tips used in atomic force microscopes admitted under 9810.00.60. Removes contaminants without damaging 10nm tip radius. Essential for nanotechnology surface characterization.
Duty Rate — Japan → United States
12.5%
Rate breakdown
9903.05.4912.5%Except for products described in headings 9903.05.85–9903.05.92, articles the product of Japan, with an ad valorem (or ad valorem equivalent) rate of duty under column 1 less than 12.5 percent, as provided for in U.S. note 52 to this subchapter
Import Tips
• Document AFM resolution specifications requiring clean cantilevers
• Include materials science research programs using surface analysis
• Specify cantilever types and plasma cleaning protocols