Atomic Force Microscope Cantilever Cleaning Station from China
Plasma cleaning station specifically designed for AFM cantilevers and tips used in atomic force microscopes admitted under 9810.00.60. Removes contaminants without damaging 10nm tip radius. Essential for nanotechnology surface characterization.
Duty Rate — China → United States
12.5%
Rate breakdown
9903.05.3112.5%Section 301 (forced labor) — additional 12.5% ad valorem on products of China
Import Tips
• Document AFM resolution specifications requiring clean cantilevers
• Include materials science research programs using surface analysis
• Specify cantilever types and plasma cleaning protocols