9030.90.89.21/Near-Field Probe Kit for EMI Debugging on Oscilloscopes/Japan

Near-Field Probe Kit for EMI Debugging on Oscilloscopes from Japan

EMI near-field probe kit for oscilloscopes under 9030.31, diagnosing electromagnetic interference in PCB designs. Classified 9030.90.89.21 as accessory for electrical quantity checking excluding ionizing types. Includes H-field and E-field probes.

Duty Rate — Japan → United States

12.5%

Rate breakdown

9903.05.4912.5%Except for products described in headings 9903.05.85–9903.05.92, articles the product of Japan, with an ad valorem (or ad valorem equivalent) rate of duty under column 1 less than 12.5 percent, as provided for in U.S. note 52 to this subchapter

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Import Tips

• FCC Part 15 compliance statements required

• Probe sensitivity curves tying to scope inputs

• Avoid 'general antenna' declaration