Active FET Oscilloscope Probe from Japan
Low-noise active FET probe for high-impedance oscilloscope measurements up to 1GHz bandwidth. Powered via scope auxiliary port with <1pF input capacitance for sensitive analog circuits. HTS 9030.90.46.00 as specialized high-frequency oscilloscope accessory.
Duty Rate — Japan → United States
12.5%
Rate breakdown
9903.05.4912.5%Except for products described in headings 9903.05.85–9903.05.92, articles the product of Japan, with an ad valorem (or ad valorem equivalent) rate of duty under column 1 less than 12.5 percent, as provided for in U.S. note 52 to this subchapter
Import Tips
• Active probes contain semiconductors—declare ESD protection and handling requirements
• Calibration data mandatory; scopes reject uncalibrated probes affecting classification proof
• Avoid 'general probe' description; specify FET input stage and scope power requirements