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9030.90.46.00/Active FET Oscilloscope Probe/Japan

Active FET Oscilloscope Probe from Japan

Low-noise active FET probe for high-impedance oscilloscope measurements up to 1GHz bandwidth. Powered via scope auxiliary port with <1pF input capacitance for sensitive analog circuits. HTS 9030.90.46.00 as specialized high-frequency oscilloscope accessory.

Duty Rate — Japan → United States

12.5%

Rate breakdown

9903.05.4912.5%Section 301 (forced labor) — Japan (col1 rate < 12.5 percent): MFN < 12.5% → total duty capped at 12.5%
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Import Tips

• Active probes contain semiconductors—declare ESD protection and handling requirements

• Calibration data mandatory; scopes reject uncalibrated probes affecting classification proof

• Avoid 'general probe' description; specify FET input stage and scope power requirements

Active FET Oscilloscope Probe from Japan — Import Duty Rate | HTS 9030.90.46.00