XRF Handheld Spectrometer from Japan
A portable X-ray fluorescence spectrometer used for non-destructive elemental analysis of materials like metals, soil, and alloys in field applications. It falls under HTS 9027.89.80.60 as a physical analysis instrument employing X-ray technology to measure atomic composition. This classification covers specialized apparatus for physical property analysis beyond basic measurement tools.
Duty Rate — Japan → United States
12.5%
Rate breakdown
9903.05.4912.5%Section 301 (forced labor) — Japan (col1 rate < 12.5 percent): MFN < 12.5% → total duty capped at 12.5%
Import Tips
• Verify FCC compliance for X-ray emitting devices and obtain proper radiation safety certifications before import
• Include detailed technical specifications and calibration certificates in documentation to avoid customs reclassification