XRF Handheld Spectrometer from Japan
A portable X-ray fluorescence spectrometer used for non-destructive elemental analysis of materials like metals, soil, and alloys in field applications. It falls under HTS 9027.89.80.60 as a physical analysis instrument employing X-ray technology to measure atomic composition. This classification covers specialized apparatus for physical property analysis beyond basic measurement tools.
Duty Rate — Japan → United States
10%
Rate breakdown
9903.03.0110%Except for products described in headings 9903.03.02–9903.03.11, articles the product of any country, as provided for in subdivision (aa) of U.S. note 2 to this subchapter
Import Tips
• Verify FCC compliance for X-ray emitting devices and obtain proper radiation safety certifications before import
• Include detailed technical specifications and calibration certificates in documentation to avoid customs reclassification