XRF Handheld Spectrometer from Japan
A portable X-ray fluorescence spectrometer used for non-destructive elemental analysis of materials like metals, soil, and alloys in field applications. It falls under HTS 9027.89.80.60 as a physical analysis instrument employing X-ray technology to measure atomic composition. This classification covers specialized apparatus for physical property analysis beyond basic measurement tools.
Duty Rate — Japan → United States
12.5%
Rate breakdown
9903.05.4912.5%Except for products described in headings 9903.05.85–9903.05.92, articles the product of Japan, with an ad valorem (or ad valorem equivalent) rate of duty under column 1 less than 12.5 percent, as provided for in U.S. note 52 to this subchapter
Import Tips
• Verify FCC compliance for X-ray emitting devices and obtain proper radiation safety certifications before import
• Include detailed technical specifications and calibration certificates in documentation to avoid customs reclassification