Photothermal Microscope for Thermal Analysis from Japan
Microscopy system combining IR excitation with thermal imaging for localized thermal property mapping. Classed under HTS 9027.50.8020 as optical thermal analysis instrument. Ideal for semiconductors and thin films.
Duty Rate — Japan → United States
12.5%
Rate breakdown
9903.05.4912.5%Section 301 (forced labor) — Japan (col1 rate < 12.5 percent): MFN < 12.5% → total duty capped at 12.5%
Import Tips
• Provide resolution specs to confirm analytical vs. general microscope use
• Check ITAR/EAR for dual-use optical tech in microscopy
• Avoid 9011 misclassification by emphasizing thermal function over imaging