Transmission Electron Microscope Specimen Holder from Japan
A specialized grid holder for thin-section samples in transmission electron microscopes (TEMs), designed for high-vacuum and tilt functionality. It qualifies for HTS 9012.90.00.00 as an accessory dedicated to non-optical microscopes. Used in ultrastructural studies of viruses and nanomaterials.
Duty Rate — Japan → United States
12.5%
Rate breakdown
9903.05.4912.5%Except for products described in headings 9903.05.85–9903.05.92, articles the product of Japan, with an ad valorem (or ad valorem equivalent) rate of duty under column 1 less than 12.5 percent, as provided for in U.S. note 52 to this subchapter
Import Tips
• Include TEM model compatibility and vacuum rating in import invoices
• Avoid bulk packaging declarations; specify single-unit research use