Transmission Electron Microscope Specimen Holder from Japan
A specialized grid holder for thin-section samples in transmission electron microscopes (TEMs), designed for high-vacuum and tilt functionality. It qualifies for HTS 9012.90.00.00 as an accessory dedicated to non-optical microscopes. Used in ultrastructural studies of viruses and nanomaterials.
Duty Rate — Japan → United States
12.5%
Rate breakdown
9903.05.4912.5%Section 301 (forced labor) — Japan (col1 rate < 12.5 percent): MFN < 12.5% → total duty capped at 12.5%
Import Tips
• Include TEM model compatibility and vacuum rating in import invoices
• Avoid bulk packaging declarations; specify single-unit research use