Transmission Electron Microscope Specimen Holder from Japan
A specialized grid holder for thin-section samples in transmission electron microscopes (TEMs), designed for high-vacuum and tilt functionality. It qualifies for HTS 9012.90.00.00 as an accessory dedicated to non-optical microscopes. Used in ultrastructural studies of viruses and nanomaterials.
Duty Rate — Japan → United States
10%
Rate breakdown
9903.03.0110%Except for products described in headings 9903.03.02–9903.03.11, articles the product of any country, as provided for in subdivision (aa) of U.S. note 2 to this subchapter
Import Tips
• Include TEM model compatibility and vacuum rating in import invoices
• Avoid bulk packaging declarations; specify single-unit research use