SEM Secondary Electron Detector from Japan
Scintillator-based detector for capturing secondary electrons in scanning electron microscopes. Essential HTS 9012.90.00.00 part for surface topography imaging. Converts electrons to photons for PMT readout.
Duty Rate — Japan → United States
12.5%
Rate breakdown
9903.05.4912.5%Section 301 (forced labor) — Japan (col1 rate < 12.5 percent): MFN < 12.5% → total duty capped at 12.5%
Import Tips
• Specify electron energy range and SEM model
• Handle as fragile optics in shipping