Scanning Electron Microscope Sample Stage from Japan
A motorized XY stage for holding and precisely positioning specimens under a scanning electron microscope. Classified under HTS 9012.90.00.00 as it is principally suitable for use with SEMs (heading 9012). Enables automated imaging of nanoscale features in semiconductors and biology.
Duty Rate — Japan → United States
12.5%
Rate breakdown
9903.05.4912.5%Section 301 (forced labor) — Japan (col1 rate < 12.5 percent): MFN < 12.5% → total duty capped at 12.5%
Import Tips
• Provide stage movement specs (e.g
• micron precision) to confirm dedication to 9012 microscopes
• Declare as 'dedicated SEM accessory' on entry forms to avoid scrutiny as general lab equipment
• Check for vacuum compatibility certification, common pitfall leading to reclassification