Microscope Diffraction Pattern Camera from Japan
A digital imaging camera optimized for capturing electron diffraction patterns from non-optical microscopes like TEMs. Falls under HTS 9012.90.00.00 as a principal accessory for diffraction apparatus in heading 9012. Essential for crystallographic analysis.
Duty Rate — Japan → United States
12.5%
Rate breakdown
9903.05.4912.5%Section 301 (forced labor) — Japan (col1 rate < 12.5 percent): MFN < 12.5% → total duty capped at 12.5%
Import Tips
• Submit sensor specs showing electron sensitivity, not photon-based
• Pair with microscope purchase docs for set classification if applicable