Microscope Diffraction Pattern Camera from Japan
A digital imaging camera optimized for capturing electron diffraction patterns from non-optical microscopes like TEMs. Falls under HTS 9012.90.00.00 as a principal accessory for diffraction apparatus in heading 9012. Essential for crystallographic analysis.
Duty Rate — Japan → United States
12.5%
Rate breakdown
9903.05.4912.5%Except for products described in headings 9903.05.85–9903.05.92, articles the product of Japan, with an ad valorem (or ad valorem equivalent) rate of duty under column 1 less than 12.5 percent, as provided for in U.S. note 52 to this subchapter
Import Tips
• Submit sensor specs showing electron sensitivity, not photon-based
• Pair with microscope purchase docs for set classification if applicable