Electron Microscope Objective Lens from Japan
A precision electromagnetic lens assembly designed specifically for use in scanning electron microscopes (SEMs) to focus the electron beam on samples. It falls under HTS 9012.90.00.00 as a dedicated accessory for non-optical microscopes in heading 9012. These lenses are critical for achieving high-resolution imaging in materials science and biology.
Duty Rate — Japan → United States
12.5%
Rate breakdown
9903.05.4912.5%Except for products described in headings 9903.05.85–9903.05.92, articles the product of Japan, with an ad valorem (or ad valorem equivalent) rate of duty under column 1 less than 12.5 percent, as provided for in U.S. note 52 to this subchapter
Import Tips
• Verify compatibility with specific microscope models via manufacturer specs for proper classification under heading 9012
• Include detailed technical datasheets in documentation to prove principal use with non-optical microscopes
• Avoid misclassification as general optical parts (9002); ensure end-use declaration specifies SEM or TEM application