Atomic Force Microscope Probe Tips from Mexico
Silicon cantilever tips with nanoscale sharp points for scanning surfaces in atomic force microscopes (AFMs), a type of non-optical microscope. HTS 9012.90.00.00 applies as accessories for 9012 microscopes. Used for topography mapping at atomic resolution.
Duty Rate — Mexico → United States
10%
Rate breakdown
9903.05.5510%Except for products described in headings 9903.05.85–9903.05.92 and 9903.05.94, articles the product of Mexico, as provided for in U.S. note 52 to this subchapter
Import Tips
• Specify tip radius (e.g
• <10nm) and cantilever specs for classification
• Import in research quantities with lab end-use statements