9012.90.00.00/Atomic Force Microscope Probe Tips/Mexico

Atomic Force Microscope Probe Tips from Mexico

Silicon cantilever tips with nanoscale sharp points for scanning surfaces in atomic force microscopes (AFMs), a type of non-optical microscope. HTS 9012.90.00.00 applies as accessories for 9012 microscopes. Used for topography mapping at atomic resolution.

Duty Rate — Mexico → United States

10%

Rate breakdown

9903.03.0110%Except for products described in headings 9903.03.02–9903.03.11, articles the product of any country, as provided for in subdivision (aa) of U.S. note 2 to this subchapter
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Import Tips

• Specify tip radius (e.g

• <10nm) and cantilever specs for classification

• Import in research quantities with lab end-use statements

Atomic Force Microscope Probe Tips from Mexico — Import Duty Rate | HTS 9012.90.00.00