Atomic Force Microscope Probe Tips from Japan
Silicon cantilever tips with nanoscale sharp points for scanning surfaces in atomic force microscopes (AFMs), a type of non-optical microscope. HTS 9012.90.00.00 applies as accessories for 9012 microscopes. Used for topography mapping at atomic resolution.
Duty Rate — Japan → United States
10%
Rate breakdown
9903.03.0110%Except for products described in headings 9903.03.02–9903.03.11, articles the product of any country, as provided for in subdivision (aa) of U.S. note 2 to this subchapter
Import Tips
• Specify tip radius (e.g
• <10nm) and cantilever specs for classification
• Import in research quantities with lab end-use statements