9012.90.00.00/Atomic Force Microscope Probe Tips/Japan

Atomic Force Microscope Probe Tips from Japan

Silicon cantilever tips with nanoscale sharp points for scanning surfaces in atomic force microscopes (AFMs), a type of non-optical microscope. HTS 9012.90.00.00 applies as accessories for 9012 microscopes. Used for topography mapping at atomic resolution.

Duty Rate — Japan → United States

12.5%

Rate breakdown

9903.05.4912.5%Section 301 (forced labor) — Japan (col1 rate < 12.5 percent): MFN < 12.5% → total duty capped at 12.5%

Calculate with your customs value Verify classification with AI

Import Tips

• Specify tip radius (e.g

• <10nm) and cantilever specs for classification

• Import in research quantities with lab end-use statements