9012.90.00.00/Atomic Force Microscope Probe Tips/Germany

Atomic Force Microscope Probe Tips from Germany

Silicon cantilever tips with nanoscale sharp points for scanning surfaces in atomic force microscopes (AFMs), a type of non-optical microscope. HTS 9012.90.00.00 applies as accessories for 9012 microscopes. Used for topography mapping at atomic resolution.

Duty Rate — Germany → United States

10%

Rate breakdown

9903.05.3910%Section 301 (forced labor) — European Union member state (col1 rate < 10 percent): MFN < 10% → total duty capped at 10%

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Import Tips

• Specify tip radius (e.g

• <10nm) and cantilever specs for classification

• Import in research quantities with lab end-use statements