9012.90.00.00/Atomic Force Microscope Probe Tips/China

Atomic Force Microscope Probe Tips from China

Silicon cantilever tips with nanoscale sharp points for scanning surfaces in atomic force microscopes (AFMs), a type of non-optical microscope. HTS 9012.90.00.00 applies as accessories for 9012 microscopes. Used for topography mapping at atomic resolution.

Duty Rate — China → United States

37.5%

Rate breakdown

9903.88.0125%Except as provided in headings 9903.88.05, 9903.88.06, 9903.88.07, 9903.88.08, 9903.88.10, 9903.88.11, 9903.88.14, 9903.88.19, 9903.88.50, 9903.88.52, 9903.88.58, 9903.88.60, 9903.88.62, 9903.88.66, 9903.88.67, 9903.88.68, or 9903.88.69, articles the product of China, as provided for in U.S. note 20(a) to this subchapter and as provided for in the subheadings enumerated in U.S. note 20(b) [to this subchapter]

9903.05.3112.5%Section 301 (forced labor) — additional 12.5% ad valorem on products of China

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Import Tips

• Specify tip radius (e.g

• <10nm) and cantilever specs for classification

• Import in research quantities with lab end-use statements