</>Build with Tariff Intelligence|Programmatic access to tariff calculations and HS code classification.Explore Developer Resources →

Atomic Force Microscope Probe Tips from Canada

Silicon cantilever tips with nanoscale sharp points for scanning surfaces in atomic force microscopes (AFMs), a type of non-optical microscope. HTS 9012.90.00.00 applies as accessories for 9012 microscopes. Used for topography mapping at atomic resolution.

Duty Rate — Canada → United States

10%

Rate breakdown

9903.05.2910%Section 301 (forced labor) — additional 10% ad valorem on products of Canada

Import Tips

Specify tip radius (e.g

<10nm) and cantilever specs for classification

Import in research quantities with lab end-use statements

Atomic Force Microscope Probe Tips from Canada — Import Duty Rate | HTS 9012.90.00.00