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8549.29.00.00/Defective Gold-Plated Semiconductor Test Probes/Mexico

Defective Gold-Plated Semiconductor Test Probes from Mexico

Rejected gold-plated probes from semiconductor testing equipment, scrapped for metal recovery due to wear or manufacturing defects. This electrical waste is principally valued for its gold content rather than reuse. Classified in 8549.29.00.00 as other precious metal recovery scrap.

Duty Rate — Mexico → United States

10%

Rate breakdown

9903.05.5510%Section 301 (forced labor) — additional 10% ad valorem on products of Mexico
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Import Tips

• Provide manufacturing defect reports and recycler's acceptance letter; ensure no hazardous substances exceed RoHS limits; use proper NAICS codes for scrap importers on entry forms

Defective Gold-Plated Semiconductor Test Probes from Mexico — Import Duty Rate | HTS 8549.29.00.00