Defective Gold-Plated Semiconductor Test Probes from Japan
Rejected gold-plated probes from semiconductor testing equipment, scrapped for metal recovery due to wear or manufacturing defects. This electrical waste is principally valued for its gold content rather than reuse. Classified in 8549.29.00.00 as other precious metal recovery scrap.
Duty Rate — Japan → United States
12.5%
Rate breakdown
9903.05.4912.5%Except for products described in headings 9903.05.85–9903.05.92, articles the product of Japan, with an ad valorem (or ad valorem equivalent) rate of duty under column 1 less than 12.5 percent, as provided for in U.S. note 52 to this subchapter
Import Tips
• Provide manufacturing defect reports and recycler's acceptance letter; ensure no hazardous substances exceed RoHS limits; use proper NAICS codes for scrap importers on entry forms