Defective Gold-Plated Semiconductor Test Probes from China
Rejected gold-plated probes from semiconductor testing equipment, scrapped for metal recovery due to wear or manufacturing defects. This electrical waste is principally valued for its gold content rather than reuse. Classified in 8549.29.00.00 as other precious metal recovery scrap.
Duty Rate — China → United States
35%
Rate breakdown
9903.03.0110%Except for products described in headings 9903.03.02–9903.03.11, articles the product of any country, as provided for in subdivision (aa) of U.S. note 2 to this subchapter
9903.88.0325%Except as provided in headings 9903.88.13, 9903.88.18, 9903.88.33, 9903.88.34, 9903.88.35, 9903.88.36, 9903.88.37, 9903.88.38, 9903.88.40, 9903.88.41, 9903.88.43, 9903.88.45, 9903.88.46, 9903.88.48, 9903.88.56, 9903.88.64, 9903.88.66, 9903.88.67, 9903.88.68, or 9903.88.69, articles the product of China, as provided for in U.S. note 20(e) to this subchapter and as provided for in the subheadings enumerated in U.S. note 20(f)
Import Tips
• Provide manufacturing defect reports and recycler's acceptance letter; ensure no hazardous substances exceed RoHS limits; use proper NAICS codes for scrap importers on entry forms