Plasma cleaner machines that remove organic contaminants from electron microscopy specimens and specimen holders
Electrical machines and apparatus, having individual functions, not specified or included elsewhere in this chapter; parts thereof: > Other machines and apparatus: > Other: > Other: > Plasma cleaner machines that remove organic contaminants from electron microscopy specimens and specimen holders
Duty Rate (from China)
Except for products described in headings 9903.03.02–9903.03.11, articles the product of any country, as provided for in subdivision (aa) of U.S. note 2 to this subchapter
Except as provided in headings 9903.88.05, 9903.88.06, 9903.88.07, 9903.88.08, 9903.88.10, 9903.88.11, 9903.88.14, 9903.88.19, 9903.88.50, 9903.88.52, 9903.88.58, 9903.88.60, 9903.88.62, 9903.88.66, 9903.88.67, 9903.88.68, or 9903.88.69, articles the product of China, as provided for in U.S. note 20(a) to this subchapter and as provided for in the subheadings enumerated in U.S. note 20(b) [to this subchapter]
Products classified under HTS 8543.70.97.00
Fischione 1020 Plasma Cleaner
The Fischione 1020 is a compact low-cost plasma cleaner designed specifically for removing organic contaminants from electron microscopy specimens and specimen holders using oxygen or argon plasma. It features a microprocessor-controlled RF generator operating at 13.56 MHz and a vacuum chamber compatible with standard TEM and SEM sample holders. This machine falls under HTS 8543.70.97.00 as a specialized electrical apparatus for cleaning microscopy samples through plasma generation.
Gatan 682 Precision Plasma Cleaning System
Gatan's 682 system provides precise plasma cleaning for TEM grids, SEM stubs, and specimen holders by generating reactive oxygen species to remove hydrocarbons. It includes a hinged quartz chamber, digital timers, and automatic pressure control for reproducible cleaning cycles. Classified under HTS 8543.70.97.00 due to its dedicated function for electron microscopy sample preparation.
Emitech K1050X Plasma Asher
The Emitech K1050X is a turbomolecular-pumped plasma asher that removes organic contamination from electron microscopy specimens using high-vacuum RF plasma. It features a 360° rotating sample table and microprocessor controls for uniform cleaning of multiple TEM grids simultaneously. This equipment qualifies for HTS 8543.70.97.00 as it specifically targets electron microscopy sample holders.
South Bay Technology PC-300 Plasma Cleaner
South Bay's PC-300 provides plasma cleaning for SEM and TEM specimens with a 4″x4″ chamber and 100W RF generator operating at 13.56 MHz. It effectively removes carbon contamination from specimen holders using oxygen plasma without damaging delicate samples. Falls under HTS 8543.70.97.00 for its electron microscopy-specific cleaning function.
XEI Scientific EVACTRON MP Plasma Cleaner
XEI's EVACTRON MP uses downstream microwave plasma to generate oxygen radicals for cleaning electron microscopy specimens without direct RF exposure to samples. The system includes a remote plasma source connected via Teflon tubing to the sample chamber, preventing sample heating. Classified under HTS 8543.70.97.00 for specialized microscopy specimen decontamination.
Harrick Plasma PDC-32G Plasma Cleaner
Harrick's PDC-32G is a compact glow discharge plasma cleaner for preparing electron microscopy samples by removing organic contaminants from grids and holders. It features digital microprocessor controls, automatic timing, and interchangeable glass chambers. This laboratory instrument qualifies for HTS 8543.70.97.00 due to its microscopy specimen cleaning function.
Diener Electronic Nano Plasma Cleaner
Diener's Nano plasma system cleans sub-micron electron microscopy specimens using low-pressure RF plasma in a compact 1.5L chamber. Designed for high-resolution TEM and SEM holders, it prevents hydrocarbon buildup that causes imaging artifacts. Classified under HTS 8543.70.97.00 for electron microscopy specimen preparation.
March Plasma Systems FlexTrak Plasma Cleaner
March's FlexTrak uses conveyorized RF plasma cleaning specifically configured for electron microscopy specimen holders in high-throughput labs. It maintains base pressures below 100 mTorr while processing multiple sample carriers simultaneously. Meets HTS 8543.70.97.00 criteria for automated microscopy sample decontamination.