SiC MOSFET Test Wafer from China
4-inch silicon carbide test wafer with process control monitor (PCM) structures and unmounted MOSFET dice for automotive traction inverters. Classified under HTS 8541.59.00.40 as semiconductor device wafers. Used for yield monitoring and process qualification.
Duty Rate — China → United States
50%
Rate breakdown
9903.91.0550%Effective with respect to entries on or after January 1, 2025, articles the product of China, as provided for in subdivision (f) of U.S. note 31 to this subchapter
9903.03.030%Articles the product of any country, as provided for in subdivision (aa)(ii) of U.S. note 2 to this subchapter
Import Tips
• Include test structure layouts and electrical parameter targets; declare as developmental material if not production yield; ensure traceability for automotive IATF 16949 compliance