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8536.90.40.00/Samtec SEARAY Wafer Test Probes/Mexico

Samtec SEARAY Wafer Test Probes from Mexico

High-density spring probe array for wafer-level IC burn-in testing. Wafer prober under 8536.90.4000.

Duty Rate — Mexico → United States

10%

Rate breakdown

9903.05.5510%Section 301 (forced labor) — additional 10% ad valorem on products of Mexico
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Import Tips

• Pitch and cycle life specifications

• Cleanroom packaging requirements