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8536.90.40.00/Samtec SEARAY Wafer Test Probes/Japan

Samtec SEARAY Wafer Test Probes from Japan

High-density spring probe array for wafer-level IC burn-in testing. Wafer prober under 8536.90.4000.

Duty Rate — Japan → United States

12.5%

Rate breakdown

9903.05.4912.5%Section 301 (forced labor) — Japan (col1 rate < 12.5 percent): MFN < 12.5% → total duty capped at 12.5%
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Import Tips

• Pitch and cycle life specifications

• Cleanroom packaging requirements