8536.90.40.00/Samtec SEARAY Wafer Test Probes/Japan

Samtec SEARAY Wafer Test Probes from Japan

High-density spring probe array for wafer-level IC burn-in testing. Wafer prober under 8536.90.4000.

Duty Rate — Japan → United States

10%

Rate breakdown

9903.03.0110%Except for products described in headings 9903.03.02–9903.03.11, articles the product of any country, as provided for in subdivision (aa) of U.S. note 2 to this subchapter

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Import Tips

• Pitch and cycle life specifications

• Cleanroom packaging requirements