8536.90.40.00/Samtec SEARAY Wafer Test Probes/Japan

Samtec SEARAY Wafer Test Probes from Japan

High-density spring probe array for wafer-level IC burn-in testing. Wafer prober under 8536.90.4000.

Duty Rate — Japan → United States

12.5%

Rate breakdown

9903.05.4912.5%Except for products described in headings 9903.05.85–9903.05.92, articles the product of Japan, with an ad valorem (or ad valorem equivalent) rate of duty under column 1 less than 12.5 percent, as provided for in U.S. note 52 to this subchapter

Calculate with your customs value Verify with the Tariff Assistant

Import Tips

• Pitch and cycle life specifications

• Cleanroom packaging requirements