8536.90.40.00/Samtec SEARAY Wafer Test Probes/Canada

Samtec SEARAY Wafer Test Probes from Canada

High-density spring probe array for wafer-level IC burn-in testing. Wafer prober under 8536.90.4000.

Duty Rate — Canada → United States

10%

Rate breakdown

9903.05.2910%Except for products described in headings 9903.05.85–9903.05.93, articles the product of Canada, as provided for in U.S. note 52 to this subchapter

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Import Tips

• Pitch and cycle life specifications

• Cleanroom packaging requirements