Samtec SEARAY Wafer Test Probes from Canada
High-density spring probe array for wafer-level IC burn-in testing. Wafer prober under 8536.90.4000.
Duty Rate — Canada → United States
10%
Rate breakdown
9903.05.2910%Section 301 (forced labor) — additional 10% ad valorem on products of Canada
Import Tips
• Pitch and cycle life specifications
• Cleanroom packaging requirements