Wafer Slicing Saw Calibration Pattern from Japan
Diamond-patterned test piece for calibrating wafer slicing saws from semiconductor boules, per statistical note (a)(ii)(B). Falls under HTS 8480.30.00.00 as specialized molding pattern for semiconductor equipment.
Duty Rate — Japan → United States
12.5%
Rate breakdown
9903.05.4912.5%Except for products described in headings 9903.05.85–9903.05.92, articles the product of Japan, with an ad valorem (or ad valorem equivalent) rate of duty under column 1 less than 12.5 percent, as provided for in U.S. note 52 to this subchapter
Import Tips
• Document kerf loss specs and boule slicing process linkage
• Declare as consumable calibration tool, not blade replacement