Crystal Defect Etcher from China

Automated wet bench station using chemical etching to reveal and measure bulk defects in semiconductor crystals before wafering, ensuring material quality. Includes thickness mapping. Under HTS 8479.79.00.00 as quality preparation equipment.

Duty Rate — China → United States

17.5%

Rate breakdown

9903.03.0110%Except for products described in headings 9903.03.02–9903.03.11, articles the product of any country, as provided for in subdivision (aa) of U.S. note 2 to this subchapter
9903.88.157.5%Except as provided in headings 9903.88.39, 9903.88.42, 9903.88.44, 9903.88.47, 9903.88.49, 9903.88.51, 9903.88.53, 9903.88.55, 9903.88.57, 9903.88.65, 9903.88.66, 9903.88.67, 9903.88.68, or 9903.88.69, articles the product of China, as provided for in U.S. note 20(r) to this subchapter and as provided for in the subheadings enumerated in U.S. note 20(s)

Import Tips

Chemical handling safety data mandatory; etch rate uniformity specs

Pitfall: chemical apparatus under 8419