Monocrystalline Boule Inspector from China
Automated inspection station using laser scanning and imaging to detect defects in semiconductor crystal boules before processing. HTS 8473.40.86.00 as accessory equipment integral to heading 8472 wafer manufacturing apparatus. Provides defect mapping for yield optimization.
Duty Rate — China → United States
37.5%
Rate breakdown
9903.88.0125%Except as provided in headings 9903.88.05, 9903.88.06, 9903.88.07, 9903.88.08, 9903.88.10, 9903.88.11, 9903.88.14, 9903.88.19, 9903.88.50, 9903.88.52, 9903.88.58, 9903.88.60, 9903.88.62, 9903.88.66, 9903.88.67, 9903.88.68, or 9903.88.69, articles the product of China, as provided for in U.S. note 20(a) to this subchapter and as provided for in the subheadings enumerated in U.S. note 20(b) [to this subchapter]
9903.05.3112.5%Section 301 (forced labor) — additional 12.5% ad valorem on products of China
Import Tips
• Classify with process equipment when integral to production line, not standalone testing
• Include software specifications for boule defect classification algorithms
• Careful distinction from Chapter 90 measuring instruments