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Float Zone Crystal Weight Monitoring Electronic Scale from China

High-accuracy electronic scale for monitoring weight in float zone semiconductor crystal growth, using electronic means to gauge process stability and purity. Classified HTS 8423.89.1000 for weighing machinery in semiconductor boule production via float zone method. Critical for slicing into uniform wafers.

Duty Rate — China → United States

35%

Rate breakdown

9903.03.0110%Except for products described in headings 9903.03.02–9903.03.11, articles the product of any country, as provided for in subdivision (aa) of U.S. note 2 to this subchapter
9903.88.0125%Except as provided in headings 9903.88.05, 9903.88.06, 9903.88.07, 9903.88.08, 9903.88.10, 9903.88.11, 9903.88.14, 9903.88.19, 9903.88.50, 9903.88.52, 9903.88.58, 9903.88.60, 9903.88.62, 9903.88.66, 9903.88.67, 9903.88.68, or 9903.88.69, articles the product of China, as provided for in U.S. note 20(a) to this subchapter and as provided for in the subheadings enumerated in U.S. note 20(b) [to this subchapter]

Import Tips

Include float zone method certifications to tie to statistical notes on semiconductor equipment

Ensure anti-static and cleanroom compatibility docs for compliance

Avoid misdeclaration as general lab equipment by specifying semiconductor end-use