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Cryogenic Wafer Probe Station Refrigerator from Mexico

Integrated refrigeration unit for cryogenic probe stations used to test semiconductor wafers at temperatures below -100°C. Enables electrical characterization of devices under extreme cold conditions. Falls under HTS 8418.99.8060 as semiconductor processing refrigerating parts.

Duty Rate — Mexico → United States

25%

Rate breakdown

9903.82.0925%Except as provided for in headings 9903.82.16 and 9903.85.68, articles of copper and derivative aluminum and steel articles, as provided for in subdivisions (c)(vi)–(viii) of U.S. note 16 to this subchapter
9903.03.060%Articles of aluminum, of steel, or of copper or derivative aluminum or steel articles; passenger vehicles (sedans, sport utility vehicles, crossover utility vehicles, minivans, and cargo vans) and light trucks; parts of passenger vehicles (sedans, sport utility vehicles, crossover utility vehicles, minivans, and cargo vans) and light trucks; medium- and heavy-duty vehicles; parts of medium- and heavy-duty vehicles; wood products; and semiconductor articles, of any country, as provided in subdivision (aa)(v) of U.S. note 2 to this subchapter

Import Tips

Include end-user statements confirming semiconductor fab use; ensure cryogenic specs meet Chapter 84 notes

Avoid declaring as complete testing instrument

Cryogenic Wafer Probe Station Refrigerator from Mexico — Import Duty Rate | HTS 8418.99.80.60