8418.99.80.60/Cryogenic Wafer Probe Station Refrigerator/Canada

Cryogenic Wafer Probe Station Refrigerator from Canada

Integrated refrigeration unit for cryogenic probe stations used to test semiconductor wafers at temperatures below -100°C. Enables electrical characterization of devices under extreme cold conditions. Falls under HTS 8418.99.8060 as semiconductor processing refrigerating parts.

Duty Rate — Canada → United States

10%

Rate breakdown

9903.03.0110%Except for products described in headings 9903.03.02–9903.03.11, articles the product of any country, as provided for in subdivision (aa) of U.S. note 2 to this subchapter
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Import Tips

• Include end-user statements confirming semiconductor fab use; ensure cryogenic specs meet Chapter 84 notes

• Avoid declaring as complete testing instrument

Cryogenic Wafer Probe Station Refrigerator from Canada — Import Duty Rate | HTS 8418.99.80.60