Thermo Fisher Helios 5 DualBeam FIB-SEM from Japan
The Thermo Fisher Helios 5 DualBeam combines focused ion beam milling with electron beam imaging, featuring semiconductor lift-out grids and wafer handling for sample preparation. It falls under tariff item 9031.80.00 as an other measuring or checking instrument for semiconductor analysis.
Duty Rate — Japan → Canada
0%
Import Tips
• Classify the Helios 5 under 9031.80.00 as a measuring instrument, not as a machine tool
• Provide CBSA with detailed specifications on its metrology and inspection functions
• Verify if the equipment is subject to any controlled goods regulations