Wafer Surface Particle Counter from China
A laser-based airborne and surface particle measurement tool for quantifying particulate contamination on semiconductor wafers during fabrication. It scans surfaces to detect particles as small as 10nm, ensuring cleanliness. This qualifies as an other optical measuring instrument under tariff item 9031.49.90.
Duty Rate — China → Canada
0%
Import Tips
• Provide CBSA with the laser scanning specifications to confirm classification under 9031.49.90
• Verify if the counter qualifies for duty relief under semiconductor manufacturing equipment programs
• Ensure the goods are declared as optical measuring instruments, not as air quality monitors