Semiconductor Wafer Cleanliness Tester from United States
An optical tester for non-destructive measurement of surface particulate and organic contamination on bare silicon wafers. It employs dark-field microscopy for real-time cleanroom monitoring. This is an other optical measuring instrument under tariff item 9031.49.90.
Duty Rate — United States → Canada
0%
Import Tips
• Document the dark-field microscopy method to support classification under 9031.49.90
• Check if the tester is eligible for duty remission under semiconductor equipment programs
• Ensure the import declaration specifies the non-destructive testing function